Value analysis tear-down : a new process for product development and innovation /
By: Sato, Yoshihiko
Title By: Kaufman, J. Jerry
Material type: BookPublisher: New York : Industrial Press : Society of Manufacturing Engineers, 2005.Edition: 1st ed.Description: x, 206 p. : ill ; 24 cm.ISBN: 0831132035 (professional/textbook : alk. paper)Program: MEMSubject(s): Value analysis (Cost control) | Industrial productivity | New products | Engineering economyDDC classification: 658.5/75Item type | Home library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
REGULAR | University of Wollongong in Dubai Main Collection | 658.575 SA VA (Browse shelf) | Available | T0029173 |
Total holds: 0
, Shelving location: Main Collection Close shelf browser
Includes bibliographical references (p. 199) and index.
MEM