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Value analysis tear-down : a new process for product development and innovation /

By: Sato, Yoshihiko
Title By: Kaufman, J. Jerry
Material type: BookPublisher: New York : Industrial Press : Society of Manufacturing Engineers, 2005.Edition: 1st ed.Description: x, 206 p. : ill ; 24 cm.ISBN: 0831132035 (professional/textbook : alk. paper)Program: MEMSubject(s): Value analysis (Cost control) | Industrial productivity | New products | Engineering economyDDC classification: 658.5/75
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