Sato, Yoshihiko. <br/><br/>
Value analysis tear-down :  a new process for product development and innovation / 
Yoshihiko Sato and J. Jerry Kaufman. 
 - 1st ed. 
 - New York :  Industrial Press :  Society of Manufacturing Engineers,  2005. 
 - x, 206 p. :  ill ;  24 cm. 
<br/><br/>Includes bibliographical references (p. 199) and index. 
<br/><br/>
<br/><br/><label>ISBN: </label>0831132035 (professional/textbook : alk. paper) 
<br/><br/><label>LCCN: </label>2004019919 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Value analysis (Cost control)<br/>Industrial productivity.<br/>New products.<br/>Engineering economy.
<br/><br/><label>LC Class. No.: </label>HD47.3  / .S38 2005 
<br/><br/><label>Dewey Class. No.: </label>658.5/75