Egerton, R. F. <br/><br/>
Physical principles of electron microscopy :  an introduction to TEM, SEM, and AEM / 
Ray F. Egerton 
 - 2nd ed. 
 - New York :  Springer Science+Business Media,  c2016. 
 - xii, 196 p. :  ill. ;  25 cm. 
<br/><br/>
<br/><br/>An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations. 
<br/><br/> This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.  
<br/><br/><label>ISBN: </label>9783319819860 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy
<br/><br/><label>Dewey Class. No.: </label>502 EG PH