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Value analysis tear-down :

Sato, Yoshihiko.

Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman. - 1st ed. - New York : Industrial Press : Society of Manufacturing Engineers, 2005. - x, 206 p. : ill ; 24 cm.

Includes bibliographical references (p. 199) and index.

ISBN: 0831132035 (professional/textbook : alk. paper)

LCCN: 2004019919

Subjects--Topical Terms:
Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.

LC Class. No.: HD47.3 / .S38 2005

Dewey Class. No.: 658.5/75

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