LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
2014042202 |
INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781107074903 |
DEWEY DECIMAL CLASSIFICATION NUMBER |
Call number |
535 |
MAIN ENTRY--PERSONAL NAME |
Authors |
Chang, William S. C. |
Dates |
1931- |
TITLE STATEMENT |
Title |
Principles of optics for engineers : |
Subtitle |
diffraction and modal analysis / |
Statement of responsibility, etc |
William S. C. Chang |
PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication |
Cambridge : |
Publisher |
Cambridge University Press, |
Date |
c2015. |
PHYSICAL DESCRIPTION |
Extent |
x, 228 p. : |
Other Details |
ill. ; |
Size |
26 cm. |
CONTENTS |
Contents |
Introduction; 1. Optical plane waves in unbounded medium; 2. Superposition of plane waves and applications; 3. Scalar wave equation and diffraction of optical radiation; 4. Optical resonators and Gaussian beams; 5. Optical waveguides and fibers; 6. Guided wave interactions; 7. Passive guided wave devices; 8. Active optoelectronic guided wave components; Appendix. |
SUMMARY |
Summary |
Uniting classical and modern photonics approaches by presenting optical analyses as solutions of Maxwell's equations, this unique book enables students and practising engineers to fully understand the similarities and differences between the different methods. The book begins with a thorough discussion of plane wave analysis, which provides a clear understanding of optics without considering boundary condition or device configuration. It then goes on to cover diffraction analysis of many applications, including a rigorous analysis of TEM waves using Maxwell's equations with boundaries. Laser cavity modes and Gaussian beams are presented, modal analysis is covered, and approximation methods are discussed (including the perturbation technique, coupled mode analysis, and super mode analysis). With theory linked to practical examples throughout, it provides a clear understanding of the interplay between plane wave, diffraction and modal analysis, and how the different techniques can be applied to various areas including imaging, signal processing, and optoelectronic devices. |
SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Heading |
Optical engineering |
SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Heading |
Diffraction |
SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Heading |
Modal analysis |
ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
https://uowd.box.com/s/mmmy1sr4sfsm55dxwl2ac8mmevn52v67 |
Public note |
Location Map |
MAIN ENTRY--PERSONAL NAME |
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59074 |
SUBJECT ADDED ENTRY--TOPICAL TERM |
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59075 |
SUBJECT ADDED ENTRY--TOPICAL TERM |
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59076 |
SUBJECT ADDED ENTRY--TOPICAL TERM |
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59077 |