| INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9783319819860 |
| DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Call number |
502 EG PH |
| MAIN ENTRY--PERSONAL NAME |
|---|
| Authors |
Egerton, R. F. |
| TITLE STATEMENT |
|---|
| Title |
Physical principles of electron microscopy : |
| Subtitle |
an introduction to TEM, SEM, and AEM / |
| Statement of responsibility, etc |
Ray F. Egerton |
| EDITION STATEMENT |
|---|
| Edition |
2nd ed. |
| PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
New York : |
| Publisher |
Springer Science+Business Media, |
| Date |
c2016. |
| PHYSICAL DESCRIPTION |
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| Extent |
xii, 196 p. : |
| Other Details |
ill. ; |
| Size |
25 cm. |
| CONTENTS |
|---|
| Contents |
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations. |
| SUMMARY |
|---|
| Summary |
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Heading |
Electron microscopy |
| ELECTRONIC LOCATION AND ACCESS |
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| Uniform Resource Identifier |
https://uowd.box.com/s/mdfaoxuvahcxkcu9zee476uzmx9byxl2 |
| Public note |
Location Map |
| MAIN ENTRY--PERSONAL NAME |
|---|
| -- |
21405 |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| -- |
21406 |