Semiconductor devices in harsh conditions /
Title By: Weide-Zaage, Kirsten [Edited by] | Chrzanowska-Jeske, Malgorzata [Edited by] | Iniewski, Krzysztof [Managing Editor]
Material type:
BookSeries: Devices, circuits & systems series.Publisher: Boca Raton : CRC Press, Taylor & Francis Group, c2017.Description: xxii, 234 p. ; 24 cm.ISBN: 9781498743808Subject(s): Semiconductors -- Reliability | Extreme environments | Environmental testingDDC classification: 621.38152 SE MI Online resources: Location Map | Item type | Home library | Call number | Status | Date due | Barcode | Item holds |
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| REGULAR | University of Wollongong in Dubai Main Collection | 621.38152 SE MI (Browse shelf) | Available | T0055524 |
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| 621.3815 YU AD Advances in 3D integrated circuits and systems | 621.38150286 EW AS E-waste : | 621.38152 LI WI Wide bandgap semiconductor spintronics | 621.38152 SE MI Semiconductor devices in harsh conditions / | 621.38152 TW OD 2D semiconductor materials and devices | 621.38152 WI DE Wide bandgap semiconductor power devices : | 621.38152 ZH SM Smart electronic systems : |
Contents Foreword... vii Preface...ix Editors...xv Contributors... xvii Section I Radiation 1. Commercial Off-the-Shelf Components in Space Applications...3 Stefano Esposito and Massimo Violante 2. Soft Errors in Digital Circuits Subjected to Natural Radiation: Characterisation, Modelling and Simulation Issues... 21 Daniela Munteanu and Jean-Luc Autran 3. Simulation of Single-Event Effects on Fully Depleted Siliconon- Insulator (FDSOI) CMOS...43 Walter Calienes Bartra, Andreas Vladimirescu and Ricardo Reis Section II Sensors and Operating Conditions 4. Electronic Sensors for the Detection of Ovarian Cancer... 69 A. M. Whited and Raj Solanki 5. Sensors and Sensor Systems for Harsh Environment Applications...87 Andrea De Luca, Florin Udrea, Guoli Li, Yun Zeng, Nicolas Andre, Guillaume Pollissard-Quatremere, Laurent A. Francis, Denis Flandre, Zoltan Racz, Julian W. Gardner, Shan Zee Ali, Octavian Buiu, Bogdan C. Serban, Cornel Cobianu and Tracy Wotherspoon 6. III-Nitride Electronic Devices for Harsh Environments... 111 Shyh-Chiang Shen Section III Packaging and System Design 7. Packaging for Systems in Harsh Environments... 135 Marc Christopher Wurz and Susanne Bengsch 8. Corrosion Resistance of Lead-Free Solders under Environmental Stress... 149 Suhana Mohd Said and Nor Ilyana Muhd Nordin 9. From Deep Submicron Degradation Effects to Harsh Operating Environments: A Self-Healing Calibration Methodology for Performance and Reliability Enhancement... 167 Eric J. Wyers and Paul D. Franzon 10. Role of Diffusional Interfacial Sliding during Temperature Cycling and Electromigration-Induced Motion of Copper Through Silicon Via... 197 Lutz Meinshausen, Ming Liu, Indranath Dutta, Tae-Kyu Lee and Li Li
Semiconductor Devices in Harsh Conditions introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity.This book focuses on radiation, operating conditions, sensor systems, package, and system design. It is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.