Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Contributors; Preface; Future Contributions; Chapter One: Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope; 1. The Limits of Resolving Power and the Sources of Aberrations; 1.1. The First Estimate of the Resolution Limit and the Resolution Achieved at the Present Time; 1.2. Sources of Errors Which Have to Be Diminished in Order to Attain the Resolution Limit 1.3. Resolution Limit due to the Combination of Diffraction and Spherical Aberration in the Objective for Two Image Point ...1.4. Nature and Magnitude of Permissible Disturbances If the Resolution Limit for Two Points Radiating Incoherently Is to ...; 1.5. Resolution Limit of Linear Lattices, in Partially Coherent Illumination, due to Spherical and Chromatic Aberrations ...; 1.6. Zone Plates for Improving Resolution and Contrast in Bright- and Dark-Field Images; 2. The Single-Field Condenser Objective; 2.1. Principle, Ray Paths, and Construction 2.2. Electron Beam Energy and Resolution Limit for Two Incoherently Radiating Points2.3. Nature and Magnitude of Permissible Disturbances If the Resolution Limit for Two Points Radiating Incoherently Is to ...; 2.4. Resolution Limit for Linear Lattices, in Partially Coherent Illumination, When the Disturbances Are so Small That Th ...; 3. Movement of the Image During Photographic Exposure; 3.1. Movement and Heating of the Specimen; 3.2. Movement of the Electron Image due to Electric and Magnetic Fields; 4. Lack of Sharpness of the Image; 4.1. Instability in the Lenses 4.2. Noncircularity of Lenses5. Changes in the Specimen; 5.1. Interaction Between Specimen, Electron Beam, and Residual Gases; 5.2. Specimen-Space Cooling as a Means of Preventing Changes in the Specimen due to Residual Gas During Electron Irradiation; 5.3. Cooling of the Specimen as Well as Its Surroundings; 6. Self-Structure of Supporting Films; References; Chapter Two: Phase Plates for Transmission Electron Microscopy; 1. Introductory Survey; 2. Postspecimen Plates; 2.1. Geometry; 2.2. Methods of Controlling Phase Shift; 3. Theory for Postspecimen Plates; 3.1. Illumination Function 3.2. Object Function3.2.1. Disc Object; 3.2.2. Spherical Object; 3.2.3. Object of Helical Phase; 3.3. Plate Function; 3.3.1. Two General Types of Plate-Intercepting and Phase Changing; 3.3.2. Zernike Plate Geometries; 3.3.2.1. Step Transition; 3.3.2.2. Linear Transition From q=0 to q=q0 (""Full Ramp""); 3.3.3. Foucault/Hilbert Plate; 4. Images With Zernike Plates; 4.1. Size Parameter; 4.2. A Rotationally Symmetric Object and a Zernike Plate; 4.3. A Disc Object and Zernike Plate; 4.3.1. Loss Function for Disc Object and Step Phase Change at q0; 4.3.2. A Disc Object With a Step Phase Change

Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.