Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
By: Egerton, R. F
Material type:
BookPublisher: New York : Springer Science+Business Media, c2016.Edition: 2nd ed.Description: xii, 196 p. : ill. ; 25 cm.ISBN: 9783319819860Subject(s): Electron microscopyDDC classification: 502 EG PH Online resources: Location Map
Summary:
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
| Item type | Home library | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| REGULAR | University of Wollongong in Dubai Main Collection | 502 EG PH (Browse shelf) | Available | Nov2018 | T0060655 |
Total holds: 0
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| 501 WI LE Leaving us to wonder : | 501.4 BO SC Science communication : | 501.4 DE AM Am I making myself clear? : | 502 EG PH Physical principles of electron microscopy : | 502.85513 BA SC Scientific programming : | 502.8553 ES HA Hands-on introduction to LabVIEW for scientists and engineers | 502.8553 ES HA Hands-on introduction to LabVIEW for scientists and engineers |
Includes bibliographical references (p. [195]-196) and index.
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.