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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton

By: Material type: TextTextPublication details: New York : Springer Science+Business Media, c2016.Edition: 2nd edDescription: xii, 196 p. : ill. ; 25 cmISBN:
  • 9783319819860
Subject(s): DDC classification:
  • 502 EG PH
Online resources: Summary: This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
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Item type Current library Call number Status Notes Date due Barcode
REGULAR University of Wollongong in Dubai Main Collection 502 EG PH (Browse shelf(Opens below)) Available Nov2018 T0060655

Includes bibliographical references (p. [195]-196) and index.

This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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