Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman.

By: Contributor(s): Material type: TextTextPublication details: New York : Industrial Press : Society of Manufacturing Engineers, 2005.Edition: 1st edDescription: x, 206 p. : ill ; 24 cmISBN:
  • 0831132035 (professional/textbook : alk. paper)
Subject(s): DDC classification:
  • 658.5/75 22
LOC classification:
  • HD47.3 .S38 2005
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
REGULAR University of Wollongong in Dubai Main Collection 658.575 SA VA (Browse shelf(Opens below)) Available T0029173

Includes bibliographical references (p. 199) and index.

MEM

There are no comments on this title.

to post a comment.